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ConvNet similarity metric

Published
Jun 20, 2005

ConvNet similarity metric is an AI model developed by New York University (NYU) (United States), first published in June 2005. It works in the vision domain, on tasks such as face verification.

Epoch AI has no training-compute estimate for this model. It was trained on roughly 140K datapoints.

The reference paper has 4,059 citations.

Full record
Organization
New York University (NYU)
Country of organization
United States
Domain
Vision
Task
Face verification
Dataset size
140K
Citations
4,059
More from New York University (NYU)
SourceEpoch AI, 'AI Models'. Published online at epoch.ai. Retrieved 2026-07-29 from https://epoch.ai/data/ai-models. Licensed under CC BY 4.0.
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